Report/Guide

Corta, R*; Cox, M G; Cross, N R; Dotson, J R; Flack, D R; Forbes, A B; O'Donnell, J*; Peggs, G N; Prieto, E* (1998) A large reference artefact for CMM verification. NPL Report. CLM 6

Cox, M G; Forbes, A B; Harris, P M; Peggs, G N (1998) Determining CMM behaviour from measurements of standard artefacts. NPL Report. CISE 15/98

Cox, M G; Cross, N R; Flack, D R; Forbes, A B; Peggs, G N (1997) Measurement of artefacts using repositioning methods. NPL Report. CLM 2

Cox, M G; Forbes, A B; Peggs, G N (1997) CMM verification and grading. NPL Report. CLM 1

Article

Peggs, G N (2005) Measurement in the nanoworld. Nanotechnology Perceptions, 1 (1). pp. 18-23.

Peggs, G N; Lewis, A J; Leach, R K (2004) Measuring the metrology gap: three dimensional metrology at the mesoscopic level. J. Manuf. Process., 6 (1). pp. 117-124.

Peggs, G N (2003) Virtual technologies for advanced manufacturing and metrology. Int. J. Comput. Integr. Manfu., 16 (7-8). pp. 485-490.

Peggs, G N; Lewis, A J; Oldfield, S (1999) Design for a compact high accuracy CMM. Ann. CIRP, 48 (1). pp. 417-420.

Conference or Workshop Item

Peggs, G N; Lewis, A; Leach, R K (2003) Measuring in three dimensions at the mesoscopic level. In: Proceedings of the ASPE Winter Topical Meeting - Machines and Processes for Micro-scale and Meso-scale Fabrication, Metrology and Assembly., January 2003, Florida, USA.

Book Chapter/Section

Forbes, A B; Peggs, G N (1997) A large reference artefact for CMM verification. In: Laser Metrology and Machine performance III. UNSPECIFIED, pp. 393-400.