Report/Guide

Tantra, R; Boyd, R; Cackett, A; Fry, A T; Gohil, D D; Goldberg. S,; Lee, J L S; Minelli, C; Peck, R; Quincey, P; Smith, S; Snowden, J; Spencer, S; Tompkins, J; Wang, J; Yang, L (2012) Final Report on the physico-chemical characterisation of PROSPEcT engineered nanomaterials. NPL Report. AS 68

Tantra, R; Cackett, A; Wain, A J; Minelli, C; Gohil, D D; Tompkins, J; Lee, J L S; Wang, J; Yang, L; Quincey, P; Shaw, R M; Spencer, S J; Fry, A T (2010) Interim report on the physico-chemical characterisation of PROSPEcT Nanomaterials. NPL Report. AS 53

Lee, J L S; Gilmore, I S; Seah, M P; Shard, A G (2009) VAMAS project A3(d) static SIMS interlaboratory study - Part I: linearity of the intensity scale - protocol for analysis. NPL Report. AS 31

Green, F M; Lee, J L S; Gilmore, I S; Seah, M P (2006) VAMAS 2006: static SIMS interlaboratory study for intensity repeatability, mass scale accuracy and relative quantification - protocol for anaylisis. NPL Report. DQL-AS 029

Article

Havelund, R; Licciardello, A*; Bailey, J*; Tuccitto, N*; Sapuppo, D*; Gilmore, I S; Sharp, J S*; Lee, J L S; Mouhib, T*; Delcorte, A* (2013) Improving secondary ion mass spectrometry C60(n+) sputter depth profiling of challenging polymers with nitric oxide gas dosing. Anal. Chem., 85 (10). pp. 5064-5070.

Lee, J L S; Gilmore, I S; Seah, M P (2012) Linearity of the instrumental intensity scale in TOF-SIMS - a VAMAS interlaboratory study. Surf. Interface Anal., 44 (1). pp. 1-14.

Yang, L; Seah, M P; Anstis, E H; Gilmore, I S; Lee, J L S (2012) Sputtering yields of gold nanoparticles by C60 ions. J. Phys. Chem. C, 116 (16). pp. 9311-9318.

Lee, J L S; Gilmore, I S; Seah, M P; Levick, A P; Shard, A G (2012) Topography and field effects in secondary ion mass spectrometry - Part II: insulating samples. Surf. Interface Anal., 44 (2). pp. 238-245.

Ogaki, R*; Gilmore, I S; Alexander, M R*; Green, F M; Davies, M C*; Lee, J L S (2011) Surface mass spectrometry of two component drug-polymer systems: novel chromatographic separation method using gentle-secondary ion mass spectrometry (G-SIMS). Anal. Chem., 83 (10). pp. 3627-3631.

Lee, J L S; Gilmore, I S; Seah, M P; Fletcher, I W* (2011) Topography and field effects in secondary ion mass spectrometry - Part I: conducting samples. J. Am. Soc. Mass Spectrom., 22 (10). pp. 1718-1728.

Shard, A G; Foster, R*; Gilmore, I S; Lee, J L S; Ray, S; Yang, L (2011) VAMAS interlaboratory study on organic depth profiling 1: preliminary report. Surf. Interface Anal., 43 (1-2). pp. 510-513.

Lee, J L S; Nimomiya, S*; Matsuo, J*; Gilmore, I S; Seah, M P; Shard, A G (2010) Organic depth profiling of a nanostructured delta layer reference material using large argon cluster ions. Anal. Chem., 82 (1). pp. 98-105.

Yang, L; Shard, A G; Lee, J L S; Ray, S (2010) Predicting the wettability of patterned ITO surface using ToF-SIMS images. Surf. Interface Anal., 42 (6-7). pp. 911-915.

Green, F M; Gilmore, I S; Lee, J L S; Spencer, S J; Seah, M P (2010) Static SIMS - VAMAS interlaboratory study for intensity repeatability, mass scale accuracy and relative quantification. Surf. Interface Anal., 42 (3). pp. 129-138.

Lee, J L S; Gilmore, I S; Fletcher, I W*; Seah, M P (2009) Multivariate image analysis strategies for ToF-SIMS images with topography. Surf. Interface Anal., 41 (8). pp. 653-665.

Lee, J L S; Tyler, B J*; Wagner, M S*; Gilmore, I S; Seah, M P (2009) The development of standards and guides for multivariate analysis in surface chemical analysis. Surf. Interface Anal., 41 (2). pp. 76-78.

Lee, J L S; Seah, M P; Gilmore, I S (2008) Artifacts in the Sputtering of Inorganics by C60 n+. Appl. Surf. Sci., 255 (4). pp. 934-937.

Lee, J L S; Gilmore, I S; Seah, M P (2008) Quantification and methodology issues in the multivariate analysis of ToF-SIMS data for mixed organic systems. Surf. Interface Anal., 40 (1). pp. 1-14.

Lee, J L S; Gilmore, I S; Fletcher, I W*; Seah, M P (2008) Topography and field effects in the quantitative analysis of conductive surfaces using ToF-SIMS. Appl. Surf. Sci., 255 (4). pp. 1560-1563.

Book Chapter/Section

Lee, J L S; Gilmore, I S (2009) The application of multivariate data analysis techniques in surface analysis. In: Surface Analysis - The Principal Techniques (Second Edition). WileyBlackwell, pp. 563-612. ISBN 9780470017647