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Leach, R K; Chetwynd, D*; Blunt, L*; Haycocks, J; Harris, P M; Jackson, K; Oldfield, S; Reilly, S (2006) Recent advances in traceable nanoscale dimension and force metrology in the UK. Meas. Sci. Technol., 17. pp. 467-476.

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Haycocks, J; Jackson, K; Leach, R K; Garratt, J*; McDonnell, I*; Rubert, P*; Lamb, J*; Wheeler, S* (2005) Tackling the challenge of traceable surface texture measurement in three dimensions. In: 5th International Conference and 7th Annual General Meeting of the European Society for Precision Engineering and Nanotechnology, 8-11 May 2005, Montpellier, France.

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