Report/Guide

Corta, R*; Cox, M G; Cross, N R; Dotson, J R; Flack, D R; Forbes, A B; O'Donnell, J*; Peggs, G N; Prieto, E* (1998) A large reference artefact for CMM verification. NPL Report. CLM 6

Cox, M G; Cross, N R; Flack, D R; Forbes, A B; Peggs, G N (1997) Measurement of artefacts using repositioning methods. NPL Report. CLM 2

Article

Yacoot, A; Cross, N R (2003) Measurement of picometre non-linearity in an optical grating encoder using x-ray interferometry. Meas. Sci. Technol., 14. pp. 148-152.

Leach, R K; Cross, N R (2002) Low-cost traceable dynamic calibration of surface texture measuring instruments. Meas. Sci. Technol., 13. pp. N1-N4.

Conference or Workshop Item

Clarke, T A*; Wang, X; Cross, N R; Forbes, A B; Fossati, P M (2001) Performance verification for large volume metrology systems. In: LAMPDAMP 2001 5th International Conference on Laser Metrology and Machine Performance, 2001, Brighton, UK.