Report/Guide

Bannister, D J (1997) BIPM international comparison GT-RF/86-3: voltage reflection coefficient measurement in rectangular waveguide R320 at 27 GHz, 35 GHz and 40 GHz. Technical Report.

Article

Dudley, R A; Roddie, A G; Bannister, D J; Gifford, A D; Krems, T*; Facon, P* (1999) Electro-optic S-parameter and electric-field profiling measurement of microwave integrated circuits. IEE Proc. Sci. Meas. Technol., 146 (3). pp. 117-122.

Bannister, D J; Ide, J P; Yeo, S P* (1993) Phase ambiguity in waveguide transmission measurements. Microw. J., 36 (11). pp. 114-120.

Conference or Workshop Item

Dudley, R A; Roddie, A G; Bannister, D J; Krems, T*; Facon, P* (1998) Electro-optic probing of microwave circuits. In: CPEM '98 Conference on Precision Electromagnetic Measurements Conference Digest, 6-10 July 1998, Washington DC, USA.

Dudley, R A; Roddie, A G; Bannister, D J; Gifford, A D; Krems, T*; Facon, P* (1997) Electro-optic probing of microwave circuits. In: BEMC '97 8th International Conference on Electromagnetic Measurement Digest, 4-6 November 1997, National Physical Laboratory, Teddington.

Yeo, S P*; Cheng, M*; Bannister, D J; Ide, J P (1994) Detection of 180ø phase discrepancies in multiport waveguide transmission measurements. In: Proc. IMTC'94, Advanced Technologies in I & M, 10 - 12 May 1994, Hamamatsu, Japan.

Bannister, D J (1994) Verification of on-wafer S-parameter measurements. In: IEE MTT-S Int. Microwave Symposium, , WMHF Workshop Notes, accuracy in on-wafer measurements, 28 May 1994, San Diego, California, USA.

Bannister, D J; Yeo, S P*; Ide, J P (1993) Are your ANA cables in a twist? In: 19th Automated RF and Microwave Measurement Society Conference Digest, 27-28 September 1993, Leeds, UK.