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Electro-optic S-parameter and electric-field profiling measurement of microwave integrated circuits.

Dudley, R A; Roddie, A G; Bannister, D J; Gifford, A D; Krems, T*; Facon, P* (1999) Electro-optic S-parameter and electric-field profiling measurement of microwave integrated circuits. IEE Proc. Sci. Meas. Technol., 146 (3). pp. 117-122.

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Abstract

No abstract available

Item Type: Article
Subjects: Electromagnetics
Last Modified: 02 Feb 2018 13:18
URI: http://eprintspublications.npl.co.uk/id/eprint/1497

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