Dudley, R A; Roddie, A G; Bannister, D J; Gifford, A D; Krems, T*; Facon, P* (1999) Electro-optic S-parameter and electric-field profiling measurement of microwave integrated circuits. IEE Proc. Sci. Meas. Technol., 146 (3). pp. 117-122.
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Item Type: | Article |
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Subjects: | Electromagnetics |
Last Modified: | 02 Feb 2018 13:18 |
URI: | http://eprintspublications.npl.co.uk/id/eprint/1497 |
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