Bannister, D J (1994) Verification of on-wafer S-parameter measurements. In: IEE MTT-S Int. Microwave Symposium, , WMHF Workshop Notes, accuracy in on-wafer measurements, 28 May 1994, San Diego, California, USA.
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Item Type: | Conference or Workshop Item (UNSPECIFIED) |
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Subjects: | Electromagnetics Electromagnetics > RF and Microwave |
Last Modified: | 02 Feb 2018 13:19 |
URI: | http://eprintspublications.npl.co.uk/id/eprint/104 |
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