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Electro-optic probing of microwave circuits.

Dudley, R A; Roddie, A G; Bannister, D J; Krems, T*; Facon, P* (1998) Electro-optic probing of microwave circuits. In: CPEM '98 Conference on Precision Electromagnetic Measurements Conference Digest, 6-10 July 1998, Washington DC, USA.

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Abstract

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Subjects: Electromagnetics
Electromagnetics > RF and Microwave
Last Modified: 02 Feb 2018 13:18
URI: http://eprintspublications.npl.co.uk/id/eprint/1498

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