Report/Guide

Allal, D; Arz, U; Gaumann, G; Gregory, A; Hudlicka, M; Kazemipour, A; Kleine-Ostmann, T; Phung, G N; Marsik, P; Naftaly, M; Sakarya, H; Shang, X; Ulm, D; Wojciechowski, M; Zagrajek, P (2022) EURAMET project 1514 Comparison on material parameter measurements in the THz spectral range with optical, resonant and VNA based setups. Other.

Article

Shang, X; Naftaly, M; Skinner, J; Ausden, L; Gregory, A; Ridler, N M; Arz, U; Phung, G N; Ulm, D; Kleine-Ostmann, T; Allal, D; Wojciechowski, M; Kazemipour, A; Gaumann, G; Hudlicka, M (2024) Interlaboratory Comparison of Dielectric Measurements from Microwave to Terahertz Frequencies Using VNA-based and Optical-based Methods. IEEE Transactions on Microwave Theory and Techniques, 72 (11). pp. 6473-6484.

Shang, X; Ridler, N M; Stokes, D; Skinner, J; Mubarak, F; Arz, U; Phung, G N; Kuhlmann, K; Kazemipour, A; Hudlicka, M; Ziade, F (2024) Some Recent Advancements in Measurements at Millimeter-wave and Terahertz Frequencies: Advanced in High Frequency Measurements. IEEE Microwave Magazine, 25 (1). pp. 58-71.

Lozar, R; Ohlrogge, M; Weber, R; Ridler, N M; Shang, X B; Probst, T; Arz, U (2019) A Comparative Study of On-Wafer and Waveguide Module S-Parameter Measurements at D-Band Frequencies. IEEE Transactions on Microwave Theory and Techniques, 67 (8). pp. 3475-3484. ISSN 0018-9480

Conference or Workshop Item

Shang, X; Ridler, N M; Arz, U; Phung, G N; Roch-Jeune, I; Ducournau, G; Haddadi, K; Flisgen, T; Doerner, R; Allal, D; Jayasankar, D; Stake, J; Schmidt, R; Fisher, G (2023) Interlaboratory Investigation of On-wafer S parameter Measurements from 110 GHz to 1.1 THz. In: 2023 53rd European Microwave Conference (EcMC), 19-21 September 2023, Berlin, Germany.

Clarke, R G; Shang, X; Ridler, N M; Lozar, R; Probst, T; Arz, U (2020) An interlaboratory study of the reproducibility of on-wafer S-parameter measurements from 140 GHz to 220 GHz. In: 2020 94th ARFTG Microwave Measurement Symposium (ARFTG), 26-29 January 2020, San Antonio, Texas, USA.