Article

Lozar, R; Ohlrogge, M; Weber, R; Ridler, N M; Shang, X B; Probst, T; Arz, U (2019) A Comparative Study of On-Wafer and Waveguide Module S-Parameter Measurements at D-Band Frequencies. IEEE Transactions on Microwave Theory and Techniques, 67 (8). pp. 3475-3484. ISSN 0018-9480

Conference or Workshop Item

Clarke, R G; Shang, X; Ridler, N M; Lozar, R; Probst, T; Arz, U (2020) An interlaboratory study of the reproducibility of on-wafer S-parameter measurements from 140 GHz to 220 GHz. In: 2020 94th ARFTG Microwave Measurement Symposium (ARFTG), 26-29 January 2020, San Antonio, Texas, USA.