Paciello, V.; De Santis, L.; Hutzschenreuter, D.; Smith, I. (2020) A universal metadata model for metrological complex quantities. In: 2020 IEEE International Workshop on Metrology for Industry 4.0 & IOT (METROIND4.0&IOT), 3 - 5 June 2020, Roma, Italy.

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Item Type:	Conference or Workshop Item (Paper)
Subjects:	Mathematics and Scientific Computing > Modelling
Divisions:	Data Science
Identification number/DOI:	10.1109/MetroInd4.0IoT48571.2020.9138287
Last Modified:	28 Jan 2021 15:25
URI:	https://eprintspublications.npl.co.uk/id/eprint/9036