Rerucha, S*; Yacoot, A; Pham, T M*; Cizek, M*; Hucl, V*; Lazar, J*; Cip, O* (2017) Laser source for dimensional metrology: investigation of an iodine stabilized system based on narrow linewidth 633 nm DBR diode. Meas. Sci. Technol., 28 (4). 045204

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Abstract

We demonstrated that an iodine stabilized Distributed Bragg Reflector (DBR) diode based laser system lasing at a wavelength in close proximity to 633 nm could be used as an alternative laser source to the He-Ne lasers in both scientific and industrial metrology. This yields additional advantages besides the optical frequency stability and coherence: inherent traceability, wider optical frequency tuning range, higher output power and high frequency modulation capability. We experimentally investigated the characteristics of the laser source in two major steps: first using a wavelength meter referenced to a frequency comb controlled with a hydrogen maser and then on a interferometric optical bench testbed where we compared the performance of the laser system with that of a traditional frequency stabilized He-Ne laser. The results indicate that DBR diode laser system provides a good laser source for applications in dimensional (nano)metrology, especially in conjunction with novel interferometric detection methods exploiting high frequency modulation or multiaxis measurement systems.

Item Type:	Article
Subjects:	Engineering Measurements Engineering Measurements > Dimensional
Divisions:	Engineering, Materials & Electrical Science
Identification number/DOI:	10.1088/1361-6501/aa5ab9
Last Modified:	02 Feb 2018 13:13
URI:	https://eprintspublications.npl.co.uk/id/eprint/7455