Schmitt, R H*; Peterek, M*; Morse, E*; Knapp, W*; Hartig, F*; Goch, G*; Hughes, B; Forbes, A B; Estler, W T* (2016) Advances in large-scale metrology - review and future trends. CIRP Ann. - Manuf. Technol., 65 (2). pp. 643-665.

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Abstract

The field of Large-Scale Metrology has been studied extensively for many decades and represents the combination and competition of topics as diverse as geodesy and laboratory calibration. A primary reason that Large-Scale Metrology continues to represent the research frontier is that technological advances introduced and perfected at a conventional scale face additional challenges which increase non-linearly with size. This necessitates new ways of considering the entire measuring process, resulting in the application of concepts such as virtual measuring processes and cyber-physical systems. This paper reports on the continuing evolution of Large-Scale Metrology

Item Type:	Article
Keywords:	metrology, modeling, large-scale metrology
Subjects:	Engineering Measurements Engineering Measurements > Dimensional
Identification number/DOI:	10.1016/j,cirp.2016.05.002
Last Modified:	02 Feb 2018 13:13
URI:	https://eprintspublications.npl.co.uk/id/eprint/7283