Chunnilall, C J (2015) Metrology for quantum communications. In: 2015 Conference on Lasers and Electro-Optics (CLEO), 10-15 May 2015, San Jose, CA, USA.

Full text not available from this repository.

Abstract

Industrial technologies based on single photons are emerging. We report on work to develop traceable metrology for the quantum optical devices used in quantum key distribution (QKD), one of the most commercially-advanced quantum technologies.

Item Type:	Conference or Workshop Item (UNSPECIFIED)
Keywords:	Quantum communications, Quantum cryptography, Optical Standards and testing
Subjects:	Quantum Phenomena Quantum Phenomena > Quantum Information Processing and Communication
Last Modified:	02 Feb 2018 13:13
URI:	https://eprintspublications.npl.co.uk/id/eprint/6800