Claverley, J D; Burisch, A*; Leach, R K; Raatz, A* (2012) Semi-automated assembly of a MEMS-based micro-scale CMM probe and future optimization of the process chain with a view to desktop factory automation. In: Precision Assembly Technologies and Systems 6th IFIP WG 5.5 International Precision Assembly Seminar, IPAS 2012,, 12-14 February 2012, Chamonix, France.

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Abstract

The assembly process of a novel micro-scale co-ordinate measuring machine probe is presented. The process uses a semi-automated miniature robot. The initial tests used to develop the full process chain are described, and the full process chain is presented. Extensive future work is suggested to augment the presented process chain, which successfully produced four assembled probes, for more automation.

Item Type:	Conference or Workshop Item (UNSPECIFIED)
Keywords:	micro-CMM probe, MEMS, micro-assembly, desktop factory
Subjects:	Engineering Measurements Engineering Measurements > Dimensional
Last Modified:	02 Feb 2018 13:14
URI:	https://eprintspublications.npl.co.uk/id/eprint/5363