Jones, C W; Leach, R K (2008) Amplitude-wavelength space in three dimensions. In: 12th International Colloquium on Surfaces, 28-29 January 2008, Chemnitz, Germany.

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Abstract

Amplitude-wavelength (AW) space is a well-established technique for depicting the operational performance of surface texture measuring instruments. The introduction of a third parameter to AW space, the in-plane scanning speed, is described. We present a discussion of the equations derived from operational constraints and parameter interdependencies for a scanning stylus instrument: the NPL Areal Instrument. Constraints derive from instrument range, resolution, range of measurement force, probe tip geometry and the synchronisation of data acquisition. The equations combine to form a polygon in amplitude-wavelength-scanning speed space that defines the operating region of the instrument.

Item Type:	Conference or Workshop Item (UNSPECIFIED)
Subjects:	Engineering Measurements Engineering Measurements > Dimensional
Last Modified:	02 Feb 2018 13:15
URI:	https://eprintspublications.npl.co.uk/id/eprint/4078