Hegedus, M; Banerjee, R; Hutcheson, A; Barker, T; Mahashabde, S; Danilov, A V; Kubatkin, S E; Antonov, V; de Graaf, S E (2025) In situ scanning gate imaging of individual quantum two-level system defects in live superconducting circuits. Science Advances, 11 (18). eadt8586 ISSN 2375-2548

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Abstract

Scanning probe microscope locates and studies individual loss and decoherence sources in live superconducting circuits.

Item Type:	Article
Subjects:	Quantum Phenomena > Quantum Information Processing and Communication
Divisions:	Quantum Technologies
Identification number/DOI:	10.1126/sciadv.adt8586
Last Modified:	12 Mar 2026 11:16
URI:	https://eprintspublications.npl.co.uk/id/eprint/10309