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Items where Subject is "Nanoscience > Nano-Dimensional"

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Number of items at this level: 20.

H

Haycocks, J (2002) An uncertsinty budjet for the Metrological Atomic Force Microscope. NPL Report. CBTLM 24

Haycocks, J; Jackson, K (2007) Detecting and addressing the surface following errors in the calibration of step heights by atomic force microscopy. Meas. Sci. Technol., 18 (2). pp. 469-475.

L

Leach, R K (2003) Metrology and testing for micro- to nano-technology: a wish list with associated problems. In: Proceedings of euspen Topical Conference on Precision Engineering, Micro Technology, Measurement Techniques and Equipment, 19-20 May 2003, Aachen, Germany.

Leach, R K (2003) Metrology and testing of micro- and nano-systems: current situation and future needs. In: Proceedings of euspen Conference "Transferring Micro-systems Technology Through the Commercial Markets", 14-15 April 2003, NPL, UK.

Leach, R K (2001) NanoSurf IV: Traceable measurement of surface texture at the National Physical Laboratory, UK. Int. J. Mach. Tools Manuf. (UK), 41 (13-14). pp. 2113-2121.

Leach, R K (2000) NanoSurf IV: Traceable measurement of surface texture. In: Xth International Conference on Surfaces., Jan 2000, Chemnitz, Germany.

Leach, R K (2000) Traceable measurement of surface texture at the National Physical Laboratory using NanoSurf IV. Meas. Sci. Technol., 11. pp. 1162-1173.

Leach, R K; Chetwynd, D*; Blunt, L*; Haycocks, J; Harris, P M; Jackson, K; Oldfield, S; Reilly, S (2005) Recent advances in traceable nanoscale dimension and force metrology in the UK. In: ISMTII 2005 - 7th International Symposium Series on Measurement Technology and Intelligent Instruments., 6-8 September 2005, Huddersfield, UK.

Leach, R K; Chetwynd, D*; Blunt, L*; Haycocks, J; Harris, P M; Jackson, K; Oldfield, S; Reilly, S (2006) Recent advances in traceable nanoscale dimension and force metrology in the UK. Meas. Sci. Technol., 17. pp. 467-476.

Leach, R K; Haycocks, J; Jackson, K; Lewis, A; Oldfield, S; Yacoot, A (2000) Advances in traceable nanometrology at the National Physical Laboratory. In: Proc. Int. Seminar Future Directions of Nanotechnology in Europe and Japan., 18-19 September 2000, Warwick University.

Leach, R K; Haycocks, J; Jackson, K; Lewis, A; Oldfield, S; Yacoot, A (2001) Advances in traceable nanometrology at the National Physical Laboratory. Nanotechnology, 12. R1-R6.

Leach, R K; Oldfield, S; Georgakopoulos, D (2006) Traceable nanonewton force measurement at the National Physical Laboratory, UK. In: euspan 6th International Conference and 8th Annual Meeting of the European Society for Precision Engineering and Nanotechnology, 28 May -1 June 2006, Vienna, Austria.

Ludwig, F*; Kazakova, O; Fernandez Barquin, L*; Fornara, A*; Trahms, L*; Steinhoff, U*; Svedlindh, P*; Wetterskog, E*; Pankhurst, Q A*; Southern, P*; Morales, P*; Fougt Hansen, M*; Frandsen, C*; Olsson, E*; Gustafsson, S*; Gehrke, N*; Ludtke-Buzug, K*; Gruttner, C*; Jonasson, C*; Johansson, C* (2014) Magnetic, structural and particle size analysis of single- and multi-core magnetic nanoparticles. IEEE Trans. Magn., 50 (11). 5300204

M

Mills, C A; Batyrev, E; Jansen, M J R; Ahmad, M; Pathan, T S; Legge, E J; Thakur, D B; Patole, S N; Brett, D J L; Shearing, P R; van der Weijde, H; Silva, S R P (2019) Improvement in the Electrical Properties of Nickel‐Plated Steel Using Graphitic Carbon Coatings. Advanced Engineering Materials, 21 (10). 1900408 ISSN 1438-1656

Munz, M; Mills, T* (2014) Size dependence of shape and stiffness of single sessile oil nano-droplets as measured by atomic force microscopy. Langmuir, 30 (15). pp. 4243-4252.

P

Panchal, V; Cedergren, K*; Yakimova, R*; Tzalenchuk, A; Kubatkin, S*; Kazakova, O (2012) Small epitaxial graphene devices for magnetosensing applications. J. Appl. Phys., 111 (7). 07E509

Panchal, V; Cox, D; Yakimova, R*; Kazakova, O (2013) Epitaxial graphene sensors for detection of small magnetic moments. IEEE Trans. Magn., 49 (1). pp. 97-100.

R

Rajkumar, R K; Asenjo, A*; Panchal, V; Manzin, A*; Iglesias-Freire, O*; Kazakova, O (2014) Magnetic scanning gate microscopy of graphene Hall devices. J. Appl. Phys., 115 (17). 172606

T

Tietje,C*,, ; Leach, R K; Turitto, M*; Ronaldo, R*; Ratchev, S* (2009) Application of a DFµA methodology to facilitate the assembly of a micro/nano measurement device. IFIP International Federation for Information Processing, 260. pp. 5-12.

Y

Yacoot, A (2005) Metrological applications of X-ray interferometry. In: Nanscale calibration standards and methods: dimensional and related measurements in the micro- and nanometer range. Wiley-VCH. ISBN 352740502X

This list was generated on Sat Aug 8 08:05:00 2020 BST.