Report/Guide

Mansfield, A J; Wayman, J L* (2002) Best practices in testing and reporting performance of biometric devices. NPL Report. CMSC 14/02

Article

Wayman, J L*; Possolo, A*; Mansfield, A J (2013) Modern statistical and philosophical framework for uncertainty assessment in biometric performance testing. IET Biometrics, 2 (3). pp. 85-96.

Conference or Workshop Item

Matovski, D S*; Nixon, M*; Mahmoodi, S*; Mansfield, A J (2012) On including quality in applied automatic gait recognition. In: 21st International Conference on Pattern Recognition (ICPR 2012), 11-15 November 2012, Tsukuba, Japan.