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Wang, Yi; Guo, C; Shang, X; Wu, W (2021) 3‐D printed waveguide attenuators operating at ka‐band (26.5‐40 GHz ). Microwave and Optical Technology Letters, 63 (3). pp. 775-780. ISSN 0895-2477
Ma, D; Shang, X; Ridler, N M; Wu, W (2021) Assessing the Impact of Data Filtering Techniques on Material Characterization at Millimeter-Wave Frequencies. IEEE Transactions on Instrumentation and Measurement, 70. 6005904
Wang, Y; Shang, X; Ridler, N M; Naftaly, M; Dimitriadis, A I; Huang, T; Wu, W (2020) Material Measurements Using VNA-Based Material Characterization Kits Subject to Thru-Reflect-Line Calibration. IEEE Transactions on Terahertz Science and Technology, 10 (5). pp. 466-473. ISSN 2156-342X
Wang, Y; Shang, X; Ridler, N M; Huang, T; Wu, W (2020) Characterization of Dielectric Materials at WR-15 Band (50–75 GHz) Using VNA-Based Technique. IEEE Transactions on Instrumentation and Measurement, 69 (7). pp. 4930-4939. ISSN 0018-9456
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