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Items where Author is "Votsi, H"

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Votsi, H; Stant, L T; Matei, C; Salter, M J; Li, C; Ridler, N M; Aaen, P H (2020) An Interferometric Characterization Technique for Extreme Impedance Microwave Devices. In: 2020 94th ARFTG Microwave Measurement Symposium (ARFTG), 26-29 January 2020, San Antonio, Texas, USA.

Votsi, H; Li, C; Aaen, P; Ridler, N M (2017) An active interferometric method for extreme impedance on-wafer device measurements. IEEE Microwave and Wireless Components Letters, 27 (11). pp. 1034-1036.

This list was generated on Wed Oct 29 13:03:36 2025 GMT.