Article

Dudley, R A; Roddie, A G; Bannister, D J; Gifford, A D; Krems, T*; Facon, P* (1999) Electro-optic S-parameter and electric-field profiling measurement of microwave integrated circuits. IEE Proc. Sci. Meas. Technol., 146 (3). pp. 117-122.

Conference or Workshop Item

Dudley, R A; Roddie, A G; Bannister, D J; Krems, T*; Facon, P* (1998) Electro-optic probing of microwave circuits. In: CPEM '98 Conference on Precision Electromagnetic Measurements Conference Digest, 6-10 July 1998, Washington DC, USA.

Dudley, R A; Roddie, A G; Bannister, D J; Gifford, A D; Krems, T*; Facon, P* (1997) Electro-optic probing of microwave circuits. In: BEMC '97 8th International Conference on Electromagnetic Measurement Digest, 4-6 November 1997, National Physical Laboratory, Teddington.