Report/Guide

Maudgal, S; Sims, G D; Johnstone, J E; Jennett, N M (1998) Characterisation of surface roughness of fibres by atomic force microscopy. NPL Report. CMMT(MN)024

Article

Gilmore, I S; Seah, M P; Johnstone, J E (2003) Quantification issues in ToF-SSIMS and AFM co-analysis in two-phase systems, exampled by a polymer blend. Surf. Interface Anal., 35. pp. 888-896.

Seah, M P; Spencer, S J; Gilmore, I S; Johnstone, J E (2000) Depth resolution in sputter depth profiling - characterisation of a tantalum pentoxide on tantalum certified reference material. Surf. Interface Anal., 29. pp. 73-81.

Seah, M P; Spencer, S J; Cumpson, P J; Johnstone, J E (2000) Sputter - induced cone and filament formation ob InP and AFM tip shape determination. Surf. Interface Anal., 29. pp. 782-790.

Seah, M P; Spencer, S J; Cumpson, P J; Johnstone, J E (2000) Sputter-induced cone and filiment formation on InP and AFM tip shapes determination. Surf. Interface Anal., 29. pp. 782-790.

Conference or Workshop Item

Gilmore, I S; Seah, M P; Johnstone, J E (1999) Static SIMS: towards unfragmented mass spectra - the G-SIMS procedure. In: 12th International Conference on Secondary Ion Mass Spectrometry (SIMS), September 1999, Brussels, Belgium.

Gilmore, I S; Seah, M P; Johnstone, J E (1999) Static SIMS: towards unfragmented mass spectra - the G_SIMS procedure. In: SIMS XII Secondary Ion Mass Spectrometry, 5-10 September 1999, Brussels, Belgium.