Li, Z*; Sotto, M*; Liu, F*; Husain, M K*; Zeimpekis, I*; Yoshimoto, H*; Tani, K*; Sasago, Y*; Hisamoto, D*; Fletcher, J D; Kataoka, M; Tsuchiya, Y*; Saito, S* (2017) Random-telegraph-noise by resonant tunnelling at low temperatures. In: 2017 IEEE Electron Devices Technology and Manufacturing Conference (EDTM), 28 February - 2 March 2017, Toyama, Japan.

Liu, F*; Husain, M K*; Li, Z*; Sotto, M S H*; Burt, D*; Fletcher, J D; Kataoka, M; Tsuchiya, Y*; Saito, S* (2017) Transport properties in silicon nanowire transistors with atomically flat interfaces. In: 2017 IEEE Electron Devices Technology and Manufacturing Conference (EDTM), 28 February - 2 March 2017, Toyama, Japan.

Li, Z*; Husain, M K*; Yoshimoto, H*; Tani, K*; Sasago, Y*; Hisamoto, D*; Fletcher, J D; Kataoka, M; Tsuchiya, Y*; Saito, S* (2017) Single carrier trapping and de-trapping in scaled silicon complementary metal-oxide-semiconductor field-effect transistors at low temperatures. Semiconduct. Sci. Technol., 32 (7). 075001