Li, Z*; Husain, M K*; Yoshimoto, H*; Tani, K*; Sasago, Y*; Hisamoto, D*; Fletcher, J D; Kataoka, M; Tsuchiya, Y*; Saito, S* (2017) Single carrier trapping and de-trapping in scaled silicon complementary metal-oxide-semiconductor field-effect transistors at low temperatures. Semiconduct. Sci. Technol., 32 (7). 075001

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Abstract

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Item Type:	Article
Subjects:	Quantum Phenomena Quantum Phenomena > Nanophysics
Divisions:	Quantum Science
Identification number/DOI:	10.1088/1361-6641/aa6910
Last Modified:	02 Feb 2018 13:12
URI:	http://eprintspublications.npl.co.uk/id/eprint/7576

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