Li, Z*; Husain, M K*; Yoshimoto, H*; Tani, K*; Sasago, Y*; Hisamoto, D*; Fletcher, J D; Kataoka, M; Tsuchiya, Y*; Saito, S* (2017) Single carrier trapping and de-trapping in scaled silicon complementary metal-oxide-semiconductor field-effect transistors at low temperatures. Semiconduct. Sci. Technol., 32 (7). 075001
Full text not available from this repository.Abstract
No abstract available
Item Type: | Article |
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Subjects: | Quantum Phenomena Quantum Phenomena > Nanophysics |
Divisions: | Quantum Science |
Identification number/DOI: | 10.1088/1361-6641/aa6910 |
Last Modified: | 02 Feb 2018 13:12 |
URI: | http://eprintspublications.npl.co.uk/id/eprint/7576 |
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