Article

Ireland, J; Reuvekamp, P G; Williams, J M; Peral, D; Diaz de Aguilar, D; Sanmamed, Y A; Sira, M; Maslan, S; Rzodkiewicz, P; Bruszewski, P; Sadkowski, G; Sosso, A; Cabral, V; Malmbekk, H; Pokatilov, A; Herick, J; Behr, R; Coskun Ozturk, T; Arifovic, M; Ilic, D (2023) A method for using Josephson voltage standards for direct characterization of high performance digitizers to establish AC voltage and current traceability to SI. Measurement Science and Technology, 31 (1). 015003

Belcher, A; Williams, J; Ireland, J; Iuzzolino, R; Bierzychudek, M E; Dekker, R; Herick, J; Behr, R; Schaapman, K (2018) Towards a Metrology class ADC based on Josephson junction devices. Journal of Physics: Conference Series, 1065. 052044 ISSN 1742-6588

Conference or Workshop Item

Iuzzolino, R; Bierzychudek, M E; Belcher, A; Dekker, R; Herick, J; Williams, J; Ireland, J; Schaapman, K (2018) Design and Simulation of a High-Order Sigma-Delta Continuous-Time Modulator. In: 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018), 8-13 July 2018, Paris, France.