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Publications

Items where Author is "Cuenat, A"

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Number of items: 16.

Report/Guide

Boyd, R D; Cuenat, A; Meli, F*; Klein, T*; Frase, C G*; Gleber, G*; Krumrey, M*; Duta, A*; Duta, S*; Hogstrom, R*; Prieto, E* (2011) Good practice guide for the determination of the size distributions of spherical nanoparticle samples. Measurement Good Practice Guide. 119

Reilly, S P; Leach, R K; Cuenat, A; Awan, S A; Lowe, M (2006) Overview of MEMS sensors and the metrology requirements for their manufacture. NMS Programme for Engineering Measurement 2005-2008. NPL Report. DEPC-EM 008

Article

Wells, J; Selezeva, E; Krzysteczko, P*; Hu, K*; Schumacher, H W*; Mansell, R*; Cowburn, R*; Cuenat, A; Kazakova, O (2017) Combined anomalous Nernst effect and thermography studies of ultrathin CoFeB/Pt nanowires. AIP Advances, 7 (5). 055904

Diaz-Chao, P*; Muniz-Piniella, A; Selezneva, E; Cuenat, A (2016) Precise measurement of the performance of thermoelectric modules. Meas. Sci. Technol., 27 (8). 085002

Wang, H S*; Bai, S Q*; Chen, L D*; Cuenat, A; Joshi, G*; Kleinke, H*; Konig, J*; Lee, H W*; Martin, J*; Oh, M W*; Porter, W D*; Ren, Z F*; Salvador, J*; Sharp, J*; Taylor, P*; Thompson, A J*; Tseng, Y C* (2015) International round-robin study of the thermoelectric transport properties of an n-type half-heusler compound from 300 K to 773 K. J. Electorn. Mater., 44 (11). pp. 4482-4491.

Dawson, A; Rides, M; Maxwell, A S; Cuenat, A; Samano, A R (2015) Scanning thermal microscopy techniques for polymeric thin films using temperature contrast mode to measure thermal diffusivity and a novel approach in conductivity contrast mode to the mapping of thermally conductive particles. Polym. Test., 41. pp. 198-208.

Dawson, A; Rides, M; Cuenat, A; Winkless, L (2013) Micro and nano-scale measurement of the thermophysical properties of polymeric materials using atomic force microscopy. Int. J. Thermophysics, 34 (5). pp. 865-882.

Cuenat, A; Muñiz-Piniella, A; Muñoz-Rojo, M; Tsoi, W C*; Murphy, C E (2012) Quantitative nanoscale surface voltage measurement on organic semiconductor blends. Nanotechnology, 23 (4). 045703

Meli, F*; Klein, T*; Buhr, E*; Frase, C G*; Gleber, G*; Krumrey, M*; Duta, A*; Duta, S*; Korpelainen, V*; Bellotti, R*; Picotto, G B*; Boyd, R D; Cuenat, A (2012) Traceable size determination of nanoparticles, a comparison among European metrology institutes. Meas. Sci. Technol., 23 (12). 125005

Boyd, R D; Winkless, L; Cuenat, A; Kazakova, O (2011) Mapping the placement of oligonucleotide molecules using scanning probe microscopy. Colloids Surf. B, Biointerfaces, 83 (1). pp. 10-15.

Boyd, R D; Cuenat, A (2011) New analysis procedure for fast and reliable size measurement of nanoparticles from atomic force microscopy images. J. Nanoparticle Res., 13 (1). pp. 105-113.

Boyd, R D; Pichaimuthu, S K; Cuenat, A (2011) New approach to inter-technique comparisons for nanoparticle size measurements; using atomic force microscopy, nanoparticle tracking analysis and dynamic light scattering. Colloids Surf. A Physicochem. Eng. Aspects, 387 (1-3). pp. 35-42.

Winkless, L; Martinot, E; Gee, M G; Cuenat, A (2009) Micro-tribology friction measurements on microtextured silicon. Tribology - Mater. Surf. Interfaces, 3 (4). pp. 165-174.

Kazakova, O; Gallop, J C; Cox, D C; Brown, E; Cuenat, A; Suzuki, K* (2008) Optimization of 2DEG InAs/GaSb Hall sensors for single particle detection. IEEE Trans. Magn., 44 (11 pt2). pp. 4480-4483.

Conference or Workshop Item

Bounouth, A*; Almuneau, G*; Baumgartner, H*; Cuenat, A; Gambacorti, N*; Hoffmann, J*; Kern, R*; Keinberger, F*; Krupka, J*; Lackner, D*; Pollakowski, B*; Rodriguez, T G*; Sametoglu, F*; Usydus, L*; Winter, S*; Witt, F* (2014) The ERMP project metrology for III-V materials based high efficiency multi-junction solar cells. In: 29th Conference on Precision Electromagnetic Measurements (CPEM 2014), 24-29 August 2014, Rio de Janeiro, Brazil.

Cuenat, A; Muniz-Piniella, A (2014) Electrical transport at the nanoscale: scanning spreading resistance, scanning capacitance and scanning Kelvin probe. In: 29th Conference on Precision Electromagnetic Measurements (CPEM 2014), 24-29 August 2014, Rio de Janeiro, Brazil.

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