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Electrical transport at the nanoscale: scanning spreading resistance, scanning capacitance and scanning Kelvin probe.

Cuenat, A; Muniz-Piniella, A (2014) Electrical transport at the nanoscale: scanning spreading resistance, scanning capacitance and scanning Kelvin probe. In: 29th Conference on Precision Electromagnetic Measurements (CPEM 2014), 24-29 August 2014, Rio de Janeiro, Brazil.

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Abstract

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Subjects: Advanced Materials
Advanced Materials > Functional Materials
Identification number/DOI: 10.1109/CPEM.2014.6898338
Last Modified: 02 Feb 2018 13:13
URI: http://eprintspublications.npl.co.uk/id/eprint/6414

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