Cowie, A; Cohen, L F*; Gibson, G; Li, Y H*; MacManus-Driscoll, J*; Gallop, J C (1997) Raman and XRD characterisation microstructure and microwave loss in YBCO 123 thin films. Appl. Supercond.. pp. 53-56.
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| Item Type: | Article |
|---|---|
| Subjects: | Quantum Phenomena |
| Last Modified: | 02 Feb 2018 13:18 |
| URI: | https://eprintspublications.npl.co.uk/id/eprint/933 |
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