Burton, O J; Massabuau, F C P; Veigang-Radulescu, V P; Brennan, B; Pollard, A J; Hofmann, S (2020) Integrated Wafer Scale Growth of Single Crystal Metal Films and High Quality Graphene. ACS Nano, 14 (10). pp. 13593-13601. ISSN 1936-0851

Full text not available from this repository.

Item Type:	Article
Subjects:	Nanoscience > Surface and Nanoanalysis
Divisions:	Chemical & Biological Sciences
Identification number/DOI:	10.1021/acsnano.0c05685
Last Modified:	29 Apr 2021 10:43
URI:	https://eprintspublications.npl.co.uk/id/eprint/9100