Naresh-Kumar, G.; Alasmari, A.; Kusch, G.; Edwards, P.R.; Martin, R.W.; Mingard, K.P.; Trager-Cowan, C. (2020) Metrology of crystal defects through intensity variations in secondary electrons from the diffraction of primary electrons in a scanning electron microscope. Ultramicroscopy, 213. 112977 ISSN 03043991

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Item Type:	Article
Subjects:	Advanced Materials > Microstructural Characterisation
Divisions:	Engineering
Identification number/DOI:	10.1016/j.ultramic.2020.112977
Last Modified:	13 Oct 2020 14:11
URI:	https://eprintspublications.npl.co.uk/id/eprint/8886