Havelund, R; Seah, M P; Tiddia, M; Gilmore, I S (2018) SIMS of organic materials-interface location in argon gas cluster depth profiles using negative-secondary ions. Journal of the American Society for Mass Spectrometry, 29 (4). pp. 774-785.

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Item Type:	Article
Subjects:	Nanoscience > Surface and Nanoanalysis
Divisions:	Chemical, Medical & Environmental Science
Identification number/DOI:	10.1007/s13361-018-1905-2
Last Modified:	21 Jun 2018 13:18
URI:	https://eprintspublications.npl.co.uk/id/eprint/7974