Wang, M*; Zhao, Y*; Zhou, Y*; Loh, T H (2017) The residual errors of multiport VNA measurements due to non-ideal TRM calibration. In: 2017 International Workshop on Electromagnetism (iWEM), 30 May - 1 June 217, London, UK.

Full text not available from this repository.

Abstract

No abstract available

Item Type:	Conference or Workshop Item (UNSPECIFIED)
Subjects:	Electromagnetics Electromagnetics > Wireless Communications
Divisions:	Engineering, Materials & Electrical Science
Identification number/DOI:	10.1109/iWEM.2017.7968815
Last Modified:	02 Feb 2018 13:12
URI:	https://eprintspublications.npl.co.uk/id/eprint/7665