Mihara, I; Havelund, R; Gilmore, I S (2017) Embedding-free method for preparation of cross-sections of organic materials for micro chemical analysis using gas cluster ion beam sputtering. Anal. Chem., 89 (9). pp. 4781-4785.

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Abstract

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Item Type:	Article
Subjects:	Nanoscience Nanoscience > Surface and Nanoanalysis
Divisions:	Chemical, Medical & Environmental Science
Identification number/DOI:	10.1021/acs.analchem.7b00511
Last Modified:	09 Feb 2018 13:43
URI:	https://eprintspublications.npl.co.uk/id/eprint/7556