Surana, S*; Conard, T*; Fleischmann, C*; Tait, J G*; Bastos, J P*; Voroshazi, E*; Havelund, R; Turbiez, M*; Louette, P*; Felten, A*; Poleunis, C*; Delcorte, A*; Vandervorst, W* (2016) Understanding physico-chemical aspects in the depth profiling of polymer: fullerene layers. J. Phys. Chem. C, 120 (49). pp. 28074-28082.

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Abstract

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Item Type:	Article
Subjects:	Nanoscience Nanoscience > Surface and Nanoanalysis
Identification number/DOI:	10.1021/acs.jpcc.6b09911
Last Modified:	02 Feb 2018 13:13
URI:	https://eprintspublications.npl.co.uk/id/eprint/7402