Mingard, K P; Cox, D C; Jones, H G; Gee, M G (2016) The use of focused ion beam microscopy for 3D material characterisation. Measurement Good Practice Guide. 141

Text (Measurement Good Practice Guide No. 141) MGPG141.pdf - Published Version Download (5MB)

Abstract

This Good Practice Guide to using dual-beam microscopes for materials characterisation has been written by the National Physical Laboratory (NPL). Its main objectives are as follows:

Item Type:	Report/Guide (Measurement Good Practice Guide)
Notes:	NPL made every effort to ensure all information contained in this Good Practice Guide was correct at time of publication. NPL is not responsible for any errors, omissions or obsolescence, and does not accept any liability arising from the use of these Good Practice Guides.
Subjects:	Advanced Materials Advanced Materials > Microstructural Characterisation
Last Modified:	20 Feb 2026 13:59
URI:	https://eprintspublications.npl.co.uk/id/eprint/7306