Seah, M P; Havelund, R; Gilmore, I S (2016) Systematic temperature effects in the argon cluster ion sputter depth profiling of organic materials using secondary ion mass spectrometry. J. Am. Soc. Mass Spectrom., 27 (8). pp. 1411-1418.

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Item Type:	Article
Subjects:	Nanoscience Nanoscience > Surface and Nanoanalysis
Identification number/DOI:	10.1007/s13361-016-1401-5
Last Modified:	02 Feb 2018 13:13
URI:	https://eprintspublications.npl.co.uk/id/eprint/7174