Havelund, R; Seah, M P; Gilmore, I S (2016) Sampling depths, depth shifts and depth resolutions for Bi-n(+) ion analysis in argon gas cluster depth profiles. J. Phys. Chem. B, 120 (9). pp. 2604-2611.
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| Item Type: | Article |
|---|---|
| Subjects: | Nanoscience Nanoscience > Surface and Nanoanalysis |
| Identification number/DOI: | 10.1021/acs.jpcb.5b12697 |
| Last Modified: | 02 Feb 2018 13:13 |
| URI: | https://eprintspublications.npl.co.uk/id/eprint/7068 |
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