Fischer, T*; Dietrich, P M*; Streeck, C*; Ray, S; Nutsch, A*; Shard, A G; Beckoff, B*; Unger, W E S*; Rurack, K* (2015) Quantification of variable functional-group densitites of mixed-silane monolayers on surfaces via a duel-mode fluorescence and XPS label. Anal. Chem., 87 (5). pp. 2685-2692.
Full text not available from this repository.Abstract
No abstract available
| Item Type: | Article |
|---|---|
| Subjects: | Nanoscience Nanoscience > Surface and Nanoanalysis |
| Identification number/DOI: | 10.1021/ac5038501 |
| Last Modified: | 02 Feb 2018 13:13 |
| URI: | https://eprintspublications.npl.co.uk/id/eprint/6603 |
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