Bailey, J*; Havelund, R; Shard, A G; Gilmore, I S; Alexander, M R*; Sharp, J S*; Scurr, D J* (2015) 3D ToF-SIMS imaging pf polymer multi layer films using argon cluster sputter depth profiling. ACS Appl. Mater. Interfaces, 7 (4). pp. 2654-2659.
Full text not available from this repository.Abstract
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| Item Type: | Article |
|---|---|
| Subjects: | Nanoscience Nanoscience > Surface and Nanoanalysis |
| Identification number/DOI: | 10.1021/am507663v |
| Last Modified: | 02 Feb 2018 13:13 |
| URI: | https://eprintspublications.npl.co.uk/id/eprint/6589 |
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