Mingard, K P; Day, A P*; Quested, P N (2014) Recent developments in two fundamental aspects of electron backscatter diffraction. IOP Conf. Series: Mater. Sci. Eng., 55. 012011
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| Item Type: | Article |
|---|---|
| Subjects: | Advanced Materials Advanced Materials > Microstructural Characterisation |
| Identification number/DOI: | 10.1088/1757-899X/55/1/012011 |
| Last Modified: | 02 Feb 2018 13:14 |
| URI: | https://eprintspublications.npl.co.uk/id/eprint/6141 |
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