Yang, L; Shard, A G; Lee, J L S; Ray, S (2010) Predicting the wettability of patterned ITO surface using ToF-SIMS images. Surf. Interface Anal., 42 (6-7). pp. 911-915.
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| Item Type: | Article |
|---|---|
| Subjects: | Nanoscience Nanoscience > Surface and Nanoanalysis |
| Last Modified: | 02 Feb 2018 13:15 |
| URI: | https://eprintspublications.npl.co.uk/id/eprint/4762 |
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