Brown, E; Hao, L; Cox, D C; Gallop, J C (2008) Scanning thermal microscopy probe capable of simultaneous electrical imaging and the addition of a diamond tip. J. Phys., Conf. Ser., 100 (5). 052012

Full text not available from this repository.

Abstract

No abstract available

Item Type:	Article
Subjects:	Engineering Measurements Engineering Measurements > Thermal
Last Modified:	02 Feb 2018 13:15
URI:	https://eprintspublications.npl.co.uk/id/eprint/4613