Seah, M P; Gilmore, I S; Spencer, S J (1998) XPS: energy calibration of electron spectrometers, 4 - an assessment of effects for different conditions and of the overall uncertainties. Surf. Interface Anal., 26. pp. 617-641.
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| Item Type: | Article |
|---|---|
| Subjects: | Nanoscience Nanoscience > Surface and Nanoanalysis |
| Last Modified: | 02 Feb 2018 13:18 |
| URI: | https://eprintspublications.npl.co.uk/id/eprint/4012 |
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