Shard, A G; Brewer, P J; Green, F M; Gilmore, I S (2007) Measurement of sputtering yield and damage in C60 sims depth profiling of model organic materials. Surf. Interface Anal., 39. pp. 294-298.
Full text not available from this repository.Abstract
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| Item Type: | Article |
|---|---|
| Subjects: | Nanoscience Nanoscience > Surface and Nanoanalysis |
| Last Modified: | 02 Feb 2018 13:15 |
| URI: | https://eprintspublications.npl.co.uk/id/eprint/3992 |
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