Haycocks, J; Jackson, K (2007) Detecting and addressing the surface following errors in the calibration of step heights by atomic force microscopy. Meas. Sci. Technol., 18 (2). pp. 469-475.

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Item Type:	Article
Keywords:	traceable calibration
Subjects:	Nanoscience Nanoscience > Nano-Dimensional
Last Modified:	02 Feb 2018 13:15
URI:	https://eprintspublications.npl.co.uk/id/eprint/3893