Sheridan, B; Cumpson, P J; Bailey, M (2007) Nanoscale measurement - important questions at the bottom. ISO Focus, 4 (4). pp. 43-45.

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Item Type:	Article
Subjects:	Nanoscience
Last Modified:	02 Feb 2018 13:15
URI:	https://eprintspublications.npl.co.uk/id/eprint/3848