Seah, M P; Spencer, S J (2006) Repeatable intensity calibration of an x-ray photoelectron spectrometer. J. Electron Spectrosc. Relat. Phenom., 151 (3). pp. 178-181.

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Item Type:	Article
Subjects:	Nanoscience Nanoscience > Surface and Nanoanalysis
Last Modified:	02 Feb 2018 13:16
URI:	https://eprintspublications.npl.co.uk/id/eprint/3668