Yacoot, A (2005) Metrological applications of X-ray interferometry. In: Nanscale calibration standards and methods: dimensional and related measurements in the micro- and nanometer range. Wiley-VCH. ISBN 352740502X

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Item Type:	Book Chapter/Section
Subjects:	Nanoscience Nanoscience > Nano-Dimensional
Publisher:	Wiley-VCH
Last Modified:	02 Feb 2018 13:16
URI:	https://eprintspublications.npl.co.uk/id/eprint/3582