Green, F; Gilmore, I S; Seah, M P (2006) TOF-SIMS: accurate mass scale calibration. J. Am. Soc. Mass Spectrom., 17 (4). pp. 514-523.

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Item Type:	Article
Subjects:	Nanoscience Nanoscience > Surface and Nanoanalysis
Last Modified:	02 Feb 2018 13:16
URI:	https://eprintspublications.npl.co.uk/id/eprint/3533