Clifford, C A; Seah, M P (2006) Interlaboratory comparison of reduced modulus measurement of polymers at the nanoscale using an AFM or a nanoindenter - protocol for analysis. NPL Report. DQL-AS 030

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Abstract

This report describes the protocol for analysis for an interlaboratory comparison of reduced modulus measurement of polymers at the nanoscale using an AFM or a Nanoindenter. Five samples are provided for this study, along with this protocol, which contains simple instructions for the analysis.

Item Type:	Report/Guide (NPL Report)
NPL Report No.:	DQL-AS 030
Subjects:	Nanoscience Nanoscience > Surface and Nanoanalysis
Last Modified:	02 Feb 2018 13:15
URI:	https://eprintspublications.npl.co.uk/id/eprint/3521